Xiyun He
at Shanghai Institute of Ceramics
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | December 8, 2004
Proc. SPIE. 5774, Fifth International Conference on Thin Film Physics and Applications
KEYWORDS: Thin films, Refractive index, Polarization, Optical properties, Crystals, Silicon, Atomic force microscopy, Sapphire, Transmittance, Lead

PROCEEDINGS ARTICLE | December 8, 2004
Proc. SPIE. 5774, Fifth International Conference on Thin Film Physics and Applications
KEYWORDS: Ferroelectric materials, Titanium, Roads, Electrodes, Ceramics, Dielectrics, Platinum, Scanning electron microscopy, Semiconducting wafers, System on a chip

PROCEEDINGS ARTICLE | November 29, 2000
Proc. SPIE. 4086, Fourth International Conference on Thin Film Physics and Applications
KEYWORDS: Thin films, Ferroelectric materials, FT-IR spectroscopy, Metals, Crystals, Dielectrics, Capacitance, Sol-gels, Temperature metrology, Perovskite

PROCEEDINGS ARTICLE | November 29, 2000
Proc. SPIE. 4086, Fourth International Conference on Thin Film Physics and Applications
KEYWORDS: Gold, Thin films, Ferroelectric materials, Capacitors, Polarization, Electrodes, Crystals, Interfaces, Heat treatments, Sol-gels

PROCEEDINGS ARTICLE | November 29, 2000
Proc. SPIE. 4086, Fourth International Conference on Thin Film Physics and Applications
KEYWORDS: Oxides, Thin films, Ferroelectric materials, Capacitors, Sputter deposition, Electrodes, Crystals, Scanning electron microscopy, Thin film deposition, Thin film growth

PROCEEDINGS ARTICLE | November 29, 2000
Proc. SPIE. 4086, Fourth International Conference on Thin Film Physics and Applications
KEYWORDS: Ferroelectric materials, Annealing, Crystals, X-ray diffraction, Ceramics, Composites, Dielectrics, Coating, Scanning electron microscopy, Sol-gels

Showing 5 of 6 publications
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