Xu Song
at National Institute of Metrology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Sensors, Calibration, X-rays, X-ray sources, 3D metrology, Printed circuit board testing, Standards development

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Metrology, Optical spheres, Sensors, Calibration, Error analysis, X-rays, Reconstruction algorithms, Picosecond phenomena, Printed circuit board testing, Standards development

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