Prof. Xuerong Ye
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 1105317 (2019) https://doi.org/10.1117/12.2509352
KEYWORDS: Temperature metrology, Data modeling, Neural networks, Resistance, Thermal modeling, Process modeling

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