Xueshun Shi
at The 41st Research Institute of China Electronic Technology Group Corporation
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 December 2019
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Metrology, Sensors, Copper, Monte Carlo methods, Black bodies, Integrating spheres, Radiometry, Cryogenics, Absorption

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