Dr. Yinan Zhao
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 August 2015
Proc. SPIE. 9656, International Symposium on Photonics and Optoelectronics 2015
KEYWORDS: Refractive index, Optical properties, Dielectrics, Measurement devices, Analytical research, Electro optics, Electrical engineering, Medium wave, Light wave propagation, Maxwell's equations

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