Dr. Yoshinori Takei
at Univ of Tokyo
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Mirrors, X-rays, Data analysis, Metrology

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: Mirrors, X-ray microscopy, Magnetorheological finishing, Phase retrieval, Wavefronts, Microscopes, Nickel, Spatial frequencies, X-rays, Objectives

PROCEEDINGS ARTICLE | September 15, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, Profilometers, X-rays, Motion measurement, X-ray optics, EUV optics, Sensors, Spatial resolution, Nickel, Quartz

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9588, Advances in X-Ray/EUV Optics and Components X
KEYWORDS: Mirrors, X-rays, Extreme ultraviolet, Geometrical optics, Wavefronts, X-ray optics, Chromatic aberrations, Spatial resolution, High harmonic generation, Free electron lasers

PROCEEDINGS ARTICLE | September 27, 2013
Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII
KEYWORDS: Mirrors, X-rays, Surface finishing, Nickel, X-ray microscopy, Manufacturing, Glasses, Surface roughness, Magnetorheological finishing, Polishing

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV
KEYWORDS: Mirrors, X-rays, Phase retrieval, Charge-coupled devices, Wavefronts, Linear filtering, Spherical lenses, Metrology, X-ray optics, Reflection

Showing 5 of 6 publications
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