Dr. Ya-Chieh Lai
at Cadence Design Systems Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (29)

PROCEEDINGS ARTICLE | April 10, 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Lithography, Data modeling, Manufacturing, Feature extraction, Design for manufacturing, Machine learning, Testing and analysis, Model-based design

PROCEEDINGS ARTICLE | March 20, 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Multilayers, Databases, Error analysis, Silicon, Legal, Optical proximity correction, Tolerancing, Integrated circuit design, System on a chip, Intellectual property

PROCEEDINGS ARTICLE | March 20, 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Mathematical modeling, Electronics, Integrated optics, Integrated circuits, Semiconductor manufacturing, Optical proximity correction, Integrated circuit design, Optics manufacturing, Design for manufacturability

PROCEEDINGS ARTICLE | March 20, 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Semiconductors, Electronics, Lithium, Roads, Statistical analysis, Metals, Semiconductor manufacturing, Plutonium, Astatine, Standards development

PROCEEDINGS ARTICLE | March 20, 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Metrology, Inspection, Profiling, Photomasks, Image classification, Optical proximity correction, Algorithm development, Standards development, Resolution enhancement technologies, Classification systems

PROCEEDINGS ARTICLE | March 30, 2017
Proc. SPIE. 10148, Design-Process-Technology Co-optimization for Manufacturability XI
KEYWORDS: Roads, Statistical analysis, Databases, Manufacturing, Inspection, Control systems, Semiconductor manufacturing, Optical proximity correction, Structural design, Manufacturing equipment, Semiconducting wafers, Failure analysis, Product engineering, Plutonium, New and emerging technologies, Data analysis, Design for manufacturability

Showing 5 of 29 publications
Conference Committee Involvement (2)
Design-Process-Technology Co-optimization for Manufacturability XIII
24 February 2019 | San Jose, California, United States
Design-Process-Technology Co-optimization for Manufacturability XII
28 February 2018 | San Jose, California, United States
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