Prof. Yajun Wang
at Wuhan Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (9)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Mathematical modeling, Imaging systems, Cameras, Calibration, Distortion, 3D modeling, Projection systems, Structured light

Proceedings Article | 21 April 2020 Presentation + Paper
Proc. SPIE. 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX
KEYWORDS: Point spread functions, Fringe analysis, Calibration, 3D metrology

SPIE Journal Paper | 17 February 2020
OE Vol. 59 Issue 02
KEYWORDS: Phase shifts, 3D metrology, Fringe analysis, Cameras, Projection systems, Optical engineering, 3D modeling, Reconstruction algorithms, Phase shift keying, Optical spheres

Proceedings Article | 13 May 2019 Presentation + Paper
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Optical filters, Modulation, Cameras, Phase shift keying, 3D metrology, Projection systems, High dynamic range imaging, Binary data, 3D image processing, Phase shifts

Proceedings Article | 13 May 2019 Presentation + Paper
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Fringe analysis, Phase shifting, 3D metrology

Showing 5 of 9 publications
Conference Committee Involvement (7)
Dimensional Optical Metrology and Inspection for Practical Applications XI
3 April 2022 | Orlando, Florida, United States
Optical Metrology and Inspection for Industrial Applications VIII
10 October 2021 | Nantong, Jiangsu, China
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Showing 5 of 7 Conference Committees
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