CONFERENCE PROCEEDINGS
Advanced Search
Dr. Yakov Roizin
at Tower Semiconductor Ltd
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 14 April 2019 Paper
Image sensor module and a method for evaluating an image sensor
Viktor Goldovsky, Yakov Roizin, Avi Strum, Amos Fenigstein, Yohanan Davidovich, Assaf Lahav, David Avner
Proceedings Volume 11028, 1102819 (2019) https://doi.org/10.1117/12.2519626
KEYWORDS: Image sensors, Ultraviolet radiation, Manufacturing, Silicon, Semiconducting wafers, Semiconductors, Image processing, Failure analysis, Optical filters, Deep ultraviolet
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top