Yamei Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 November 2009
Proc. SPIE. 7508, 2009 International Conference on Optical Instruments and Technology: Advanced Sensor Technologies and Applications
KEYWORDS: Sensors, Error analysis, Interfaces, LCDs, Microcontrollers, Integrated circuits, Data conversion, System integration, Integrated circuit design, Temperature metrology

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