Yan Bian
at Tianjin Univ of Technology and Education
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 31 January 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Light sources, Coherence (optics), Image processing, Image acquisition, Interferometry, Phase interferometry, Optical testing, CCD cameras, Signal processing, Optical interferometry

Proceedings Article | 11 October 2010
Proc. SPIE. 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Actuators, Light sources, Light emitting diodes, Vibration simulation, Detection and tracking algorithms, Sensors, Interferometry, Phase interferometry, Feedback control, Phase shifts

Proceedings Article | 13 October 2008
Proc. SPIE. 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration
KEYWORDS: Edge detection, Detection and tracking algorithms, Imaging systems, Cameras, Sensors, Image segmentation, Image processing, CCD cameras, CCD image sensors, Structured light

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