Dr. Yan Deng
at Chengdu Fine Optical Engineering Research Ctr
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | January 17, 2008
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Signal to noise ratio, Silica, Spatial frequencies, Interferometers, Error analysis, Fourier transforms, Interferometry, Interference (communication), Optical testing, Charge-coupled devices

PROCEEDINGS ARTICLE | May 19, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Imaging systems, Spatial frequencies, Interferometers, Error analysis, Reflectivity, Wavefronts, Collimators, Charge-coupled devices, Tolerancing, Optics manufacturing

PROCEEDINGS ARTICLE | May 19, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Optical components, Photovoltaics, Optical design, Tunable lasers, Interferometers, Calibration, Wavefronts, Optical testing, Image quality, Phase shifts

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Optical components, Photovoltaics, Tunable lasers, Interferometers, Calibration, Reflectivity, Optical testing, Image quality, Diodes, Phase shifts

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