Mr. Yan Hu
Student
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: 3D metrology, Phase measurement

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: 3D metrology, Phase measurement, Binary data

PROCEEDINGS ARTICLE | February 10, 2017
Proc. SPIE. 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016)

PROCEEDINGS ARTICLE | February 10, 2017
Proc. SPIE. 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016)
KEYWORDS: Fringe analysis, Composites

PROCEEDINGS ARTICLE | July 17, 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Diffraction, CMOS sensors, Light emitting diodes, Microscopy, Image resolution, Tomography, Phase retrieval, Wave propagation, RGB color model, Absorption

PROCEEDINGS ARTICLE | July 17, 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Microscopes, Beam splitters, Holograms, Holography, Optical signal processing, Digital holography, Digital filtering, Charge-coupled devices, Beam expanders, Digital recording

Showing 5 of 7 publications
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