Mr. Lei Yan
at Xi'an Institute of Applied Optics
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Zemax, Reflection, Imaging systems, Scattering, Sensors, Light scattering, 3D modeling, Bidirectional reflectance transmission function, Stray light, Panoramic photography

PROCEEDINGS ARTICLE | August 16, 2013
Proc. SPIE. 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
KEYWORDS: Scattering, Electrodes, Metals, Microchannel plates, Ions, Light scattering, Image resolution, Image intensifiers, Modulation transfer functions, Ion beam finishing

PROCEEDINGS ARTICLE | August 16, 2013
Proc. SPIE. 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
KEYWORDS: Imaging systems, Imaging technologies, Ultraviolet radiation, Microchannel plates, Night vision, Image enhancement, Image intensifiers, Analytical research, Missiles, Ultraviolet detectors

PROCEEDINGS ARTICLE | August 16, 2013
Proc. SPIE. 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
KEYWORDS: MATLAB, Photomultipliers, Interfaces, Gallium arsenide, Diffusion, Quantum efficiency, Optoelectronic devices, Image intensifiers, Cesium, Absorption

PROCEEDINGS ARTICLE | August 16, 2013
Proc. SPIE. 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
KEYWORDS: Contamination, Microchannel plates, Interfaces, Gallium arsenide, Gases, Night vision, Adsorption, Aluminum, Image intensifiers, Assembly equipment

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Thin films, Modulation, Scattering, Image processing, Microchannel plates, Ions, Aluminum, Image intensifiers, Modulation transfer functions, Ion beam finishing

Showing 5 of 8 publications
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