Yan Wang
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Zemax, Lens design, Aspheric lenses, Visibility, Fizeau interferometers

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Zemax, Photovoltaics, Interferometers, Wavefronts, Structural design, Mechanical engineering, Spherical lenses, Tolerancing, Fizeau interferometers

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Zemax, MATLAB, Interferometers, Wavefronts, Wavefront aberrations, Optical testing, Zernike polynomials

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