A novel absolute distance measurement method based on the optical frequency comb of the Ti:sapphire femtosecond
laser was presented. In the spectrally-resolved interferometry (SRI), all modes interference signals of the optical
frequency comb was obtained by the femtosecond light pulses traveling along different optical path between the
reference and measurement arms. The interference intensity in the frequency domain was inverse Fourier-transformed
into the time domain, and the phase peak was isolated by use of an appropriate Hamming window, then the phase
difference which was caused by the distance was resolved in the frequency domain. The simulation results indicated that
this algorithm could satisfy the demand of the small scale profile measurement with the non-ambiguity range of millimeter level, and the resolution of nanometer level. Furthermore, combined with the conventional phase ranging method, the max measurement distance of our method can be extended to several dozen meters.
A scheme is proposed for high-precision, absolute distance measurement for a theoretical arbitrary optical distance. The
approach utilizes a frequency stabilized Ti:sapphirez femtosecond pulse laser to provide a phase-locked summation of
discrete quasi-monochromatic light modes of consecutive frequencies, which is seen as an optical comb in the frequency
domain. We describe a new way of spectrally-resolved interferometry devised to measure the optical path delay between
two consecutive ultrashort pulses with high precision, which leads to an accurate means of absolute distance
measurement. A FPE(Fabry-Perot Etalon) filters smaller frequency from the broad-bandwidth femtosecond laser pulse
produced. The dispersive interferometry data permits the unambiguous measurement range to be significantly increased
compared with the dispersive interferometry used in white light to measure an absolute distance. Preliminary
experimental results are reported for a spectrally-resolved interferometry demonstrating the principle of operation and
yielding a non-ambiguity range of 5.75 mm and an associated resolution of nanometer level.
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