Dr. Yan Zhang
at Shanghai Institute of Technical Physics
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9451, Infrared Technology and Applications XLI
KEYWORDS: Mercury cadmium telluride, Annealing, Dielectrics, Interfaces, Mercury, Physics, Capacitance, Atomic layer deposition, Aluminum, Semiconducting wafers

PROCEEDINGS ARTICLE | November 20, 2014
Proc. SPIE. 9300, International Symposium on Optoelectronic Technology and Application 2014: Infrared Technology and Applications
KEYWORDS: Annealing, X-rays, Interfaces, Ions, Silicon, Chemical vapor deposition, Gallium nitride, Silicon films, Gallium, Plasma

PROCEEDINGS ARTICLE | September 2, 2014
Proc. SPIE. 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
KEYWORDS: Sensors, Electrodes, Ultraviolet radiation, Annealing, Resistance, Gallium nitride, Thermal effects, Indium gallium nitride, Internal quantum efficiency, Ultraviolet detectors

PROCEEDINGS ARTICLE | October 22, 2010
Proc. SPIE. 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
KEYWORDS: Infrared detectors, Accelerated life testing, Infrared sensors, Sensors, Microscopy, Photoresistors, Reliability, Infrared radiation, Failure analysis, Temperature metrology

Showing 5 of 12 publications
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