YanPing Wang
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 19, 2013
Proc. SPIE. 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Prisms, Sensors, Calibration, Laser beam propagation, Optical testing, Distance measurement, CCD image sensors, Laser beam diagnostics, Tolerancing, Precision calibration

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