Dr. Yana Z. Williams
AST at NASA Langley Research Ctr
SPIE Involvement:
Membership & Communities Committee | Senior status | Conference Program Committee | Author
Publications (13)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10764, Earth Observing Systems XXIII
KEYWORDS: Telescopes, Optical filters, Indium gallium arsenide, Sensors, Calibration, Radiometric corrections, Uncertainty analysis, Infrared radiation, Earth's atmosphere, Signal detection

PROCEEDINGS ARTICLE | May 31, 2013
Proc. SPIE. 8720, Photonic Applications for Aerospace, Commercial, and Harsh Environments IV
KEYWORDS: Optical fibers, Sensors, Calibration, Spectrometers, Lamps, Xenon, Spectral calibration, Charge-coupled devices, Stray light, CCD image sensors

PROCEEDINGS ARTICLE | November 11, 2010
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Phase shifting, Imaging systems, Cameras, Metals, Inspection, LCDs, 3D metrology, Projection systems, Phase measurement, 3D image processing

PROCEEDINGS ARTICLE | September 3, 2010
Proc. SPIE. 7793, Optical System Alignment, Tolerancing, and Verification IV
KEYWORDS: Near infrared, Imaging systems, Cameras, Sensors, Light scattering, Manufacturing, Inspection, Light sources and illumination, Semiconducting wafers, Tellurium

PROCEEDINGS ARTICLE | September 3, 2010
Proc. SPIE. 7806, Penetrating Radiation Systems and Applications XI
KEYWORDS: Infrared imaging, Sensors, Ultrasonography, Image segmentation, Image processing, Crystals, Inspection, Laser cutting, Semiconducting wafers, 3D image processing

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Signal to noise ratio, Defect detection, Detection and tracking algorithms, Imaging systems, Cameras, Sensors, Interference (communication), Image analysis, 3D metrology, 3D image processing

Showing 5 of 13 publications
Conference Committee Involvement (10)
Optical System Alignment, Tolerancing, and Verification XI
6 August 2017 | San Diego, California, United States
Optical System Alignment, Tolerancing, and Verification X
28 August 2016 | San Diego, California, United States
Optical System Alignment, Tolerancing, and Verification IX
9 August 2015 | San Diego, California, United States
Photonic Applications for Aviation, Aerospace, Commercial, and Harsh Environments V
19 August 2014 | San Diego, California, United States
Optical System Alignment, Tolerancing, and Verification VIII
17 August 2014 | San Diego, California, United States
Showing 5 of 10 published special sections
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