Dr. Yang Bai
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 1105310 (2019) https://doi.org/10.1117/12.2511217
KEYWORDS: Standards development, Metrology, Electromagnetism, Retroreflectors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top