Tao Yang
at Xi'an Jiaotong Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Microelectromechanical systems, Optical transfer functions, Point spread functions, Fringe analysis, Scanners, Liquid crystal on silicon, 3D metrology, Digital Light Processing

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