Multilayer structures with a thin chromium (Cr) layer embedded in the high reflective silver layer and dielectric layers, such as SiO2 and Ta2O5, are proposed. Reflectivity can be easily manipulated by adjusting the thickness of the Cr and dielectric layers. To demonstrate the potential for enhancing the flatness of reflection spectra, multilayers with average reflectivity value of 45% and 32% in the range of 450 to 900 nm are constructed, respectively. The reflectivity value exhibits a change of less than ±2.5%, and the transmittance is nearly negligible for both multilayer architectures. They can be fabricated using the physical vapor deposition technique.
Spectral image information provided by multi-spectral infrared remote sensing cameras has high application value. The registration of multi-spectral infrared camera is a key to improve the efficiency of satellite image acquisition. In order to break through the limitation of high precision of spectral segments imaging devices, a coordinate measuring and dual-path centering technology were proposed.
For the high precision requirement of spaceborne low light remote sensing camera optical registration, optical registration of dual channel for CCD and EMCCD is achieved by the high magnification optical registration system. System integration、optical registration and accuracy of optical registration scheme for spaceborne low light remote sensing camera with short focal depth and wide field of view is proposed in this paper. It also includes analysis of parallel misalignment of CCD and accuracy of optical registration. Actual registration results show that imaging clearly, MTF and accuracy of optical registration meet requirements, it provide important guarantee to get high quality image data in orbit.
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