Dr. Yannick Deshayes
Associate Professor at Univ Bordeaux 1
SPIE Involvement:
Publications (7)

Proceedings Article | 4 March 2016 Paper
R. Mostallino, M. Garcia, Y. Deshayes, A. Larrue, Y. Robert, E. Vinet, L. Bechou, M. Lecomte, O. Parillaud, M. Krakowski
Proceedings Volume 9733, 97330S (2016) https://doi.org/10.1117/12.2212984
KEYWORDS: High power lasers, Semiconductor lasers, High power diode lasers, Solid state lasers, Thermal efficiency, Indium gallium arsenide, Fiber lasers, Materials processing, Defense and security, Resistance, Finite element methods, Thermography, Reliability, Heatsinks, Temperature metrology, Optical simulations

Proceedings Article | 2 May 2014 Paper
Pamela Del Vecchio, Y. Deshayes, Simon Joly, M. Bettiati, F. Laruelle, L. Béchou
Proceedings Volume 9134, 913423 (2014) https://doi.org/10.1117/12.2052179
KEYWORDS: Semiconductor lasers, Diodes, Resistance, Polarization, Temperature metrology, Laser damage threshold, Remote sensing, Electro optics, Luminescence, Reverse modeling

Proceedings Article | 23 September 2011 Paper
R. Baillot, L. Béchou, C. Belin, T. Buffeteau, I. Pianet, C. Absalon, O. Babot, Y. Deshayes, Y. Ousten
Proceedings Volume 8123, 81230G (2011) https://doi.org/10.1117/12.893528
KEYWORDS: Light emitting diodes, Silicon, Luminescence, Gallium nitride, Coating, Polymerization, Polymers, Molecular spectroscopy, Molecules, Packaging

Proceedings Article | 11 February 2011 Paper
A. Royon, K. Bourhis, G. Papon, M. Bellec, B. Bousquet, Y. Deshayes, T. Cardinal, L. Canioni
Proceedings Volume 7925, 79250N (2011) https://doi.org/10.1117/12.874455
KEYWORDS: Glasses, Luminescence, Silver, Optical recording, Data storage, Confocal microscopy, Femtosecond phenomena, 3D optical data storage, Absorption, Microscopes

Proceedings Article | 26 April 2008 Paper
Piero Spezzigu, Laurent Bechou, Gianandrea Quadri, Olivier Gilard, Yannick Deshayes, Yves Ousten, Massimo Vanzi
Proceedings Volume 7003, 70030O (2008) https://doi.org/10.1117/12.780976
KEYWORDS: Phototransistors, Silicon, Annealing, Reliability, Diffusion, Failure analysis, Manufacturing, Interfaces, Antireflective coatings, Photodiodes

Showing 5 of 7 publications
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