Yannick Poujet
PhD Student at Univ de Franche-Comté
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 April 2006
Proc. SPIE. 6195, Nanophotonics
KEYWORDS: Finite-difference time-domain method, Silicon, Silver, Scanning electron microscopy, Near field scanning optical microscopy, Near field, Solids, Nanolithography, Near field optics, Current controlled current source

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