Yanyi Leng
at Tianjin Polytechnic Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 10, 2018
Proc. SPIE. 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017)
KEYWORDS: Defect detection, Image segmentation, Image processing, Inspection, Feature extraction, Optical inspection, Neural networks, Image classification, Convolution, Classification systems

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top