CONFERENCE PROCEEDINGS
Advanced Search
Yanzhe Fu
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 18 December 2019 Paper
A novel knife-edge method for measuring the lateral resolution of confocal Raman microscopes
Yanzhe Fu, Xiang Ding, Jiangchao Li, Jiyan Zhang
Proceedings Volume 11337, 113370B (2019) https://doi.org/10.1117/12.2542145
KEYWORDS: Polishing, Coating, Chromium, Point spread functions, Polymethylmethacrylate, Spatial resolution, Microscopes, Confocal microscopy, Silicon, Raman spectroscopy
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top