Yao Huang
at National Institute of Metrology
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Metrology, Calibration, Gyroscopes

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Metrology, Calibration, In situ metrology, Computer programming, Data acquisition, Head, Data processing, Bromine, Environmental sensing, Standards development

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Metrology, Calibration, In situ metrology, Computer programming, Data acquisition, Head, Signal processing, Bromine, Astatine, Standards development

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Metrology, Aerospace engineering, Calibration, Error analysis, Computer programming, Transform theory, Head, Optics manufacturing, Precision optics, Standards development

PROCEEDINGS ARTICLE | October 8, 2015
Proc. SPIE. 9675, AOPC 2015: Image Processing and Analysis
KEYWORDS: Target detection, Mirrors, Detection and tracking algorithms, Image processing, Image analysis, CCD cameras, Collimation, Charge-coupled devices, Algorithm development, Standards development

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Reflectors, Retroreflectors, Lasers, Interferometers, Optical encoders, Laser interferometry, Optical resolution, Laser beam diagnostics, Optics manufacturing, Laser systems engineering

Showing 5 of 8 publications
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