Jiang Yao
at Zhejiang Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Calibration, Error analysis, Interferometry, Zemax, Visualization, Numerical analysis, C++, Holograms, Confocal microscopy, Optical testing

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