Yarui Ma
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Image processing, Edge detection, Image filtering, Sensors, Binary data, Selenium, Detection and tracking algorithms, Optical filters, Chemical elements, Denoising

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