Yaseer A. Durrani
at Univ Politécnica de Madrid
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 May 2007
Proc. SPIE. 6590, VLSI Circuits and Systems III
KEYWORDS: Genetic algorithms, Statistical analysis, Switching, Error analysis, Monte Carlo methods, Telecommunications, Electronic design automation, Intellectual property, Device simulation, Tin

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