Dr. Yasser M. Sabry
Associate Professor at Si-Ware Systems
SPIE Involvement:
Area of Expertise:
Micro-optics , Optical MEMS , Microscanners , Optical cavities , MEMS actuaters , MEMS FTIR spectrometers
Profile Summary

Yasser Sabry received his BSc and MSc in electronics and communication Eng. in 2005 and 2009 from Ain Shams University, Cairo, Egypt. Now he is working toward a PhD in microelectronic systems at ESIEE Engineering School of Paris, Paris-Est University, France. From 2005 to 2008, he joined the transistor modeling team at Mentor Graphics Corporation, and he was a consultant in the innovation team of the information technology industry development agency (ITIDA) of Egypt. From 2008, he joined the MEMS division of Si-ware Systems (SWS) as a microelectronics process engineer developing SWS technology SiMOST. His research interests are in nanoelectronics, inertial MEMS sensors, Micro-optics and optical MEMS.
Publications (62)

Proceedings Article | 5 March 2021 Poster + Presentation + Paper
Proc. SPIE. 11697, MOEMS and Miniaturized Systems XX
KEYWORDS: Polymers, Spectroscopy, FT-IR spectroscopy, Polarizers, Microelectromechanical systems, Spectral resolution, Polarization, Manufacturing, Linear polarizers, Fourier transforms

Proceedings Article | 5 March 2021 Presentation + Paper
Proc. SPIE. 11681, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices X
KEYWORDS: Solar concentrators, Solar cells, 3D modeling, Ray tracing, Photovoltaics, Geometrical optics

Proceedings Article | 5 March 2021 Presentation + Paper
Proc. SPIE. 11697, MOEMS and Miniaturized Systems XX

Proceedings Article | 20 August 2020 Presentation + Paper
Proc. SPIE. 11511, Applications of Machine Learning 2020
KEYWORDS: Carbon monoxide, Signal to noise ratio, Spectrometers, FT-IR spectroscopy, Resolution enhancement technologies, Network architectures, Convolutional neural networks, Transmittance, Spectral resolution

Proceedings Article | 2 April 2020 Presentation + Paper
Proc. SPIE. 11364, Integrated Photonics Platforms: Fundamental Research, Manufacturing and Applications
KEYWORDS: Waveguides, Refractive index, Optical coherence tomography, Silicon photonics, Silicon, Resonators, Tolerancing, Finite-difference time-domain method, Reflection

Showing 5 of 62 publications
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