Yassine Tounsi
at Univ Chouaïb Doukkali
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11551, Holography, Diffractive Optics, and Applications X
KEYWORDS: Refractive index, Fringe analysis, Wavelet transforms, Digital holography, Speckle, Interferometry, Speckle pattern, Deflectometry, Holographic interferometry, Phase shifts

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11353, Optics, Photonics and Digital Technologies for Imaging Applications VI
KEYWORDS: Signal to noise ratio, Digital holography, Speckle, Denoising, Interferometry, Speckle pattern, Image quality, Data processing, Holographic interferometry, Temperature metrology

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11353, Optics, Photonics and Digital Technologies for Imaging Applications VI
KEYWORDS: Fringe analysis, Speckle, Interferometers, Interferometry, Phase interferometry, Image quality, Phase shifts

SPIE Journal Paper | 10 January 2020
OE Vol. 59 Issue 10
KEYWORDS: Demodulation, Wavelets, Fringe analysis, Interference (communication), Speckle, Discrete wavelet transforms, Modulation, Optical engineering, Speckle metrology, Image quality

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Speckle, Denoising, Interferometry, Speckle pattern, Image filtering

Showing 5 of 10 publications
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