Prof. Yasuhiko Arai
at Kansai Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (53)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Diffraction, Holography, Speckle, Interferometers, Atomic force microscopy, Speckle pattern, Speckle interferometry, 3D metrology, Objectives, Diffraction gratings

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Holograms, Holography, Digital holography, Phase interferometry, 3D image processing, Phase shifts

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Opto mechatronics, Speckle, Cameras, Speckle pattern, Speckle interferometry, Laser systems engineering

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Light sources, Fringe analysis, Speckle, Interferometers, Image processing, Denoising, Fourier transforms, Interferometry, Speckle pattern, Speckle interferometry, 3D metrology, Image filtering

PROCEEDINGS ARTICLE | April 18, 2017
Proc. SPIE. 10251, Biomedical Imaging and Sensing Conference
KEYWORDS: Holograms, 3D image reconstruction, Digital holography, Interferometry, Numerical simulations, Image sensors, Color imaging, 3D image processing

PROCEEDINGS ARTICLE | April 18, 2017
Proc. SPIE. 10251, Biomedical Imaging and Sensing Conference
KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Polarization, Interferometry, Wave plates, Image sensors, 3D image processing, Phase shifts

Showing 5 of 53 publications
Conference Committee Involvement (10)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
Showing 5 of 10 published special sections
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