Prof. Yasuhiro Mizutani
Associate Professor at Osaka Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (26)

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Confocal microscopy, Spectroscopy, Microscopy, Optical microscopy, Frequency combs, Phase imaging

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Confocal microscopy, Biomedical optics, Imaging systems, Spectroscopy, Image acquisition, Objectives, Spatial resolution

PROCEEDINGS ARTICLE | February 20, 2018
Proc. SPIE. 10505, High-Speed Biomedical Imaging and Spectroscopy III: Toward Big Data Instrumentation and Management
KEYWORDS: Hyperspectral imaging, Fabry–Perot interferometers, Polarization, Sensors, Spectroscopy, Coating, Imaging spectroscopy, Chromium, Spectral resolution, Spatial resolution

PROCEEDINGS ARTICLE | February 22, 2017
Proc. SPIE. 10076, High-Speed Biomedical Imaging and Spectroscopy: Toward Big Data Instrumentation and Management II
KEYWORDS: Terahertz radiation, Spectral resolution, Signal detection

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Optical components, Metrology, Optical spheres, Imaging systems, Optical testing, Optical tweezers, CMOS cameras, Objectives, Signal detection, Diffraction gratings

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: CMOS sensors, Prisms, Sensors, Dielectrics, Silicon, Polarizers, CMOS cameras, Dichroic materials, Absorption, Carbon nanotubes

Showing 5 of 26 publications
Conference Committee Involvement (2)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
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