Prof. Yasuhiro Takaya
Professor at Osaka Univ
SPIE Involvement:
Conference Chair | Conference Program Committee | Author
Publications (28)

SPIE Journal Paper | June 19, 2017
OE Vol. 56 Issue 06
KEYWORDS: Laser optics, Laser development, Spherical lenses, Laser metrology, 3D metrology, Metrology, Optical testing, Sensors, Phase shifts

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Optical components, Metrology, Optical spheres, Imaging systems, Optical testing, Optical tweezers, CMOS cameras, Objectives, Signal detection, Diffraction gratings

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: CMOS sensors, Prisms, Sensors, Dielectrics, Silicon, Polarizers, CMOS cameras, Dichroic materials, Absorption, Carbon nanotubes

PROCEEDINGS ARTICLE | October 31, 2016
Proc. SPIE. 10021, Optical Design and Testing VII
KEYWORDS: Hyperspectral imaging, Modulation, Imaging systems, Sensors, Image processing, Fiber lasers, Spatial light modulators, Frequency combs, Erbium, Signal detection

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Metrology, Optical trapping, Optical spheres, Particles, Optical tweezers, Distance measurement, Objectives, Aspheric lenses, Sensing systems, Signal detection

PROCEEDINGS ARTICLE | September 9, 2011
Proc. SPIE. 8097, Optical Trapping and Optical Micromanipulation VIII
KEYWORDS: Optical spheres, Sensors, Glasses, Particles, Optical testing, Optical tweezers, 3D metrology, Measurement devices, Stationary wavelet transform, Laser beam diagnostics

Showing 5 of 28 publications
Conference Committee Involvement (4)
Optomechatronic Sensors and Instrumentation III
8 October 2007 | Lausanne, Switzerland
Optomechatronic Sensors and Instrumentation II
3 October 2006 | Boston, Massachusetts, United States
Optomechatronic Sensors and Instrumentation
5 December 2005 | Sapporo, Japan
Machine Vision and its Optomechatronic Applications
26 October 2004 | Philadelphia, Pennsylvania, United States
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