Yasuji Seko
at Fuji Xerox Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2005
Proc. SPIE. 6049, Optomechatronic Sensors and Instrumentation
KEYWORDS: Monochromatic aberrations, Light sources, Light emitting diodes, 3D surface sensing, Cameras, Hough transforms, Image sensors, 3D metrology, Filtering (signal processing), 3D image processing

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