Yeon Hwa Lim
Member of Technical Staff at MagnaChip Semiconductor
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 21 March 2006 Paper
Yeon Hwa Lim, Hong Ik Kim, Jae Sung Choi, Jeong Gun Lee
Proceedings Volume 6154, 61544A (2006) https://doi.org/10.1117/12.656051
KEYWORDS: Lithography, Lithographic illumination, Logic devices, Critical dimension metrology, Photomasks, Optical proximity correction, Etching, Scanners, Electroluminescence, Semiconductors

Proceedings Article | 4 May 2005 Paper
Yeon Hwa Lim, Young Keun Kim, Jae Sung Choi, Jeong Gun Lee
Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.600437
KEYWORDS: Photoresist developing, Critical dimension metrology, Semiconducting wafers, Photoresist processing, Photoresist materials, CMOS devices, Reflectivity, Plasma etching, Etching, Lithography

Proceedings Article | 28 May 2004 Paper
Chang-Young Jeong, Yeon Hwa Lim, Hong Ik Kim, Jeong Lyeol Park, Jae Sung Choi, Jeong Gun Lee
Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.536252
KEYWORDS: Photomasks, Critical dimension metrology, Semiconducting wafers, Chromium, Optical lithography, Semiconductors, Lithographic illumination, Inspection, Cadmium, Integrated circuits

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