The Schottky barrier formation are investigated in Au/p-CdTe contacts. The contacts were manufactured by electroless deposition of Au at the surfaces prepared by wet chemical etching. The influence of the surface treatment on the Schottky barrier height are studied. The potential barrier height is determined from the photoemission current spectra measurements. The secondary ion-mass spectroscopy (SIMS) profiling is carried out to study the compositional structure in as-deposited contacts as well as stored under normal laboratory conditions during one-year period. The effect of thermal annealing on
electrical and photoelectrical properties of the contacts is studied. For comparison, the contacts Cu/p-CdTe prepared by the same method are studied too.