Dr. Yi-Chen Chuang Profile

Dr. Yi-Chen Chuang

Research Fellow

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Publications (5)

Proceedings Article | 15 October 2012 Paper

Compressive sampling methods for superresolution imaging

Yi-Chen Chuang, Richard Dudley, Michael Fiddy

Proceedings Volume 8500, 850005 (2012) https://doi.org/10.1117/12.930837

KEYWORDS: Metamaterials, Image resolution, Scattering, Sensors, Image compression, Imaging systems, Super resolution, Spatial frequencies, Image restoration, Cameras

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Proceedings Article | 15 October 2012 Paper

Superresolved image reconstruction from incomplete data

Yi-Chen Chuang, Richard Dudley, Michael Fiddy

Proceedings Volume 8500, 850009 (2012) https://doi.org/10.1117/12.930836

KEYWORDS: Metamaterials, Scattering, Inverse scattering, Image restoration, Refractive index, Image resolution, Wave propagation, Spatial frequencies, Inverse scattering problem, Near field

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Proceedings Article | 22 February 2012 Paper

Optimal arrangement of meta-atoms composing metamaterials

Yi-Chen Chuang, Richard Dudley, Michael Fiddy

Proceedings Volume 8269, 82691D (2012) https://doi.org/10.1117/12.906331

KEYWORDS: Metamaterials, Refractive index, Resonators, Wave propagation, Scattering, Image resolution, Negative refraction, Dielectrics, Superlenses, Antennas

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Proceedings Article | 16 February 2009 Paper

Optical characteristics of photonic crystals based on the fractional Talbot effect

Yi-Chen Chuang, Thomas Suleski

Proceedings Volume 7223, 72230P (2009) https://doi.org/10.1117/12.809453

KEYWORDS: Crystals, Photonic crystals, Refraction, Diffraction gratings, Refractive index, Dielectrics, Interfaces, Optical communications, Collimation, Negative refraction

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Proceedings Article | 22 January 2005 Paper

Fabrication of optical microstructures through fractional Talbot imaging

T. Suleski, Y.-C. Chuang, P. Deguzman, R. Barton

Proceedings Volume 5720, (2005) https://doi.org/10.1117/12.599125

KEYWORDS: Diffraction gratings, Photomasks, Near field optics, Diffraction, Binary data, Lithography, Computer simulations, Photoresist materials, Near field diffraction, Semiconducting wafers

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