Mr. Yi Ta Lee
at National Taiwan Normal Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII
KEYWORDS: Refractive index, Light sources, Fringe analysis, Lenses, Inspection, Fourier transforms, CCD cameras, 3D metrology, Shape analysis, 3D image processing

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