Yi Wei Xu
at Univ of New South Wales
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 30 December 2008 Paper
Proceedings Volume 7269, 72690U (2008) https://doi.org/10.1117/12.810451
KEYWORDS: Etching, Silicon, Anisotropic etching, Semiconducting wafers, Surface roughness, Atomic force microscopy, Crystals, Mirrors, Electrical engineering, Wet etching

Proceedings Article | 9 January 2008 Paper
Proceedings Volume 6800, 68001W (2008) https://doi.org/10.1117/12.759343
KEYWORDS: Etching, Oxides, Semiconducting wafers, Atomic force microscopy, Micromirrors, Silicon, Mirrors, Surface roughness, Wet etching, Scanning electron microscopy

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