Mr. Yi-Yang Tsai
at Univ of Dayton
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Beam splitters, Polishing, Microscopy, Reliability, Diagnostics, Atomic force microscopy, Ultrasonics, Scanning electron microscopy, Aluminum, Computed tomography

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Capillaries, Particles, Crystals, Nitrogen, Atomic force microscopy, Humidity, Spherical lenses, Adhesives, Liquids, Alkaline earth metals

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