Dr. Yi Ding Profile

Dr. Yi Ding

at Wuhan Univ

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Author

Publications (5)

Proceedings Article | 6 November 2023 Paper

3D point cloud denoising method based on K nearest neighbor and absolute phase recovery

Jianmin Zhang, Jiale Long, Zihao Du, Yi Ding

Proceedings Volume 12921, 129211W (2023) https://doi.org/10.1117/12.2688747

KEYWORDS: Point clouds, 3D image processing, Image segmentation, 3D modeling, Denoising, Image restoration, 3D metrology, Fringe analysis, Cameras, 3D image reconstruction

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Proceedings Article | 10 October 2020 Poster + Paper

Structured light fields 3D imaging with temporal phase unwrapping

Yi Ding, Yate Jiang, Wei Liu, Wenqing Cheng

Proceedings Volume 11552, 1155214 (2020) https://doi.org/10.1117/12.2573350

KEYWORDS: Structured light, Stereoscopy, Cameras, Fringe analysis, Phase shifts

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Proceedings Article | 24 July 2018 Paper

A new phase retrieve method for phase shifting profilometry with object in motion

Lei Lu, Haoran Guo, Chunhua Zhu, Yi Ding, Yinsen Luan, Jiangtao Xi

Proceedings Volume 10827, 108270Y (2018) https://doi.org/10.1117/12.2500871

KEYWORDS: Fringe analysis, Reconstruction algorithms, Phase shifting, Motion models, Projection systems

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Proceedings Article | 24 July 2018 Paper

Simulation study on improving the spatial resolution of absolute phase map recovered by fringe projection profilometry with the images of different resolutions

Qiong Liu, Yi Ding, Zhenwei Yuan, Lei Lu, Jiangtao Xi

Proceedings Volume 10827, 108271P (2018) https://doi.org/10.1117/12.2326823

KEYWORDS: Image resolution, Spatial resolution, Fringe analysis, Cameras, Projection systems, 3D image processing, 3D metrology, Algorithm development, 3D modeling, Image filtering

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Proceedings Article | 24 November 2016 Paper

Three-dimensional surface inspection for semiconductor components with fringe projection profilometry

Kai Peng, Ziqi Zhu, Yi Ding, Fuqin Deng, Jiangtao Xi, Yongkai Yin

Proceedings Volume 10023, 100230Y (2016) https://doi.org/10.1117/12.2246094

KEYWORDS: Inspection, Semiconductors, 3D metrology, Spatial frequencies, Electronic components, Cameras, Telecommunications, Projection systems, Fringe analysis, 3D image reconstruction

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