Yi Ding
at Tongji Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Microscopes, Inspection, X-rays, Teeth, Acoustics, Nondestructive evaluation, Interfaces, Ceramics, Manufacturing, Reflection

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top