Dr. Yi Liao
Lead Research Engineer at GE Global Research
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 19, 2015
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Optical sensors, Sensors, Inspection, Clouds, 3D modeling, Feature extraction, Optical testing, 3D metrology, Computer aided design, Tolerancing

PROCEEDINGS ARTICLE | May 14, 2015
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Confocal microscopy, Microscopes, Phase shifting, Imaging systems, Sensors, Microscopy, Manufacturing, Computed tomography, Associative arrays, Structured light

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Optical design, Eye, Moire patterns, Imaging systems, Cameras, Calibration, Error analysis, Manufacturing, Ronchi rulings, Prototyping

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Monochromatic aberrations, Imaging systems, Cameras, Interference (communication), Light sources and illumination, Software development, Image enhancement, Modulation transfer functions, Factor analysis, Prototyping

PROCEEDINGS ARTICLE | September 14, 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Infrared imaging, Sensors, Crystals, Ions, Inspection, Wafer inspection, Associative arrays, Neodymium, Semiconducting wafers, 3D image processing

PROCEEDINGS ARTICLE | September 8, 2010
Proc. SPIE. 7798, Applications of Digital Image Processing XXXIII
KEYWORDS: Light emitting diodes, Defect detection, Image segmentation, Image processing, Inspection, Head, Machine vision, Image classification, Algorithm development, Defect inspection

Showing 5 of 6 publications
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