Dr. Yi Qiao
at 3M Co
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | August 21, 2009
Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III
KEYWORDS: Refractive index, Silica, Nanoparticles, Electrodes, Metals, Particles, Diffusion, Dielectrophoresis, Microfabrication, Diffraction gratings

PROCEEDINGS ARTICLE | September 9, 2008
Proc. SPIE. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II
KEYWORDS: Refractive index, Microfluidics, Silica, Scattering, Nanoparticles, Particles, Diffusion, Fourier transforms, Optical testing, CCD cameras

PROCEEDINGS ARTICLE | March 30, 2006
Proc. SPIE. 6167, Smart Structures and Materials 2006: Smart Sensor Monitoring Systems and Applications
KEYWORDS: Spectrum analysis, Electronics, Fiber Bragg gratings, Sensors, Crystals, Multiplexing, Demodulation, Fiber optics sensors, Laser crystals, Two wave mixing

PROCEEDINGS ARTICLE | May 16, 2005
Proc. SPIE. 5758, Smart Structures and Materials 2005: Smart Sensor Technology and Measurement Systems
KEYWORDS: Fiber Bragg gratings, Interferometers, Sensors, Crystals, Multiplexing, Demodulation, Fiber optics sensors, Sensor networks, Signal detection, Two wave mixing

Conference Committee Involvement (1)
Instrumentation, Metrology, and Standards for Nanomanufacturing III
4 August 2009 | San Diego, California, United States
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