Dr. Yi Qin
at Chongqing Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2016 Paper
Y. Qin, Y. Tao, Y. F. Mao
Proceedings Volume 9805, 98052O (2016) https://doi.org/10.1117/12.2218814
KEYWORDS: Damage detection, Transducers, Numerical simulations, Detection and tracking algorithms, Scanning electron microscopy, Analytical research, Piezoelectric effects, Bessel functions, Finite element methods

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