Dr. Yi Tian
Physicist at Siemens Shanghai Medical Equipment Ltd
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 16 March 2020
Proc. SPIE. 11316, Medical Imaging 2020: Image Perception, Observer Performance, and Technology Assessment
KEYWORDS: Image visualization, Image quality, Computed tomography, Image contrast enhancement, Visibility

Proceedings Article | 16 March 2020
Proc. SPIE. 11312, Medical Imaging 2020: Physics of Medical Imaging
KEYWORDS: Detection and tracking algorithms, Image quality, Computed tomography, Reconstruction algorithms, Scattering compensation

Proceedings Article | 16 March 2020
Proc. SPIE. 11312, Medical Imaging 2020: Physics of Medical Imaging
KEYWORDS: X-ray computed tomography, Modulation, Scanners, Data acquisition

Proceedings Article | 1 March 2019
Proc. SPIE. 10948, Medical Imaging 2019: Physics of Medical Imaging
KEYWORDS: X-ray computed tomography, Image quality, Scattering compensation

Proceedings Article | 9 March 2018
Proc. SPIE. 10573, Medical Imaging 2018: Physics of Medical Imaging
KEYWORDS: X-ray computed tomography, Data modeling, Monte Carlo methods, Image quality, Convolution, Reconstruction algorithms, Scattering compensation

Showing 5 of 6 publications
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