Yibin Tian
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 17 October 2008 Paper
Proceedings Volume 7122, 71221B (2008) https://doi.org/10.1117/12.801945
KEYWORDS: Photomasks, Inspection, Semiconducting wafers, Finite-difference time-domain method, Wafer inspection, Manufacturing, Printing, Lithography, Reticles, Optical proximity correction

Proceedings Article | 5 March 2007 Paper
Yibin Tian, Kevin Shieh, Christine Wildsoet
Proceedings Volume 6426, 64260O (2007) https://doi.org/10.1117/12.701238
KEYWORDS: Modulation transfer functions, Light scattering, Point spread functions, Image quality, Optical aberrations, Wavefront sensors, Eye, Vitreous, Monochromatic aberrations, Diffraction

Proceedings Article | 20 February 2007 Paper
Proceedings Volume 6502, 65020C (2007) https://doi.org/10.1117/12.703203
KEYWORDS: Point spread functions, Imaging systems, Digital signal processing, Spatial frequencies, Monte Carlo methods, Fourier transforms, Image sensors, Wavelets, Wavelet transforms, Distributed computing

Proceedings Article | 12 February 2007 Paper
Yibin Tian, Kevin Shieh, Christine Wildsoet
Proceedings Volume 6492, 64920P (2007) https://doi.org/10.1117/12.705599
KEYWORDS: Point spread functions, Eye, Wavefronts, Fourier transforms, Retina, Wavefront sensors, Neodymium, Distributed computing, Wavelets, Fermium

Proceedings Article | 10 February 2006 Paper
Proceedings Volume 6069, 60690A (2006) https://doi.org/10.1117/12.641884
KEYWORDS: Skin, RGB color model, Digital imaging, Imaging systems, Statistical analysis, Binary data, Statistical modeling, LCDs, Pattern recognition, Image processing

Showing 5 of 6 publications
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