Yiguang Zhang
at The China Aerospace Industry Corp.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 August 2009
Proc. SPIE. 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
KEYWORDS: Infrared detectors, Microbolometers, Infrared sensors, Sensors, Manufacturing, Control systems, Image quality, Temperature sensors, Prototyping, Temperature metrology

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